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Trak 6.0

by Field Precision, Inc.

Charged-particle tracking, beam transport and electron/ion gun design.

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Trak (Vers. 6.0) is one of the most advanced codes available on any computer platform for charged-particle optics and gun design. The program applies high-accuracy finite-element techniques to calculate single-particle orbits or to simulate steady-state beams in 2D (planar or cylindrical) electric and magnetic fields. Features include effects of beam-generated electric and magnetic fields, automatic generation of input distributions, self-consistent space-charge-limited emission, and field emission. Applications include electron and ion guns, electro-optical devices, electron microscopes, vacuum microelectronics and relativistic high-power beams. (Available for Linux and Windows. Requires Mesh 5.0, EStat 5.0 and BStat 5.0.)


  • Easy-to-understand instruction manual with a library of read-to-run examples.
  • Combine effects of calculated electric and magnetic fields on independent meshes.
  • Self-consistent space- charge-limited emission from multiple sources.
  • High accuracy orbit calculations, even near electrode surfaces
  • Precision interpolation to stopping planes for lens characterization.
  • Interactive orbit and field plotting postprocessor with built-in hardcopy support.
  • Automatic calculation of self-consistent plasma surfaces for ion extraction.
  • Advanced secondary- emission models and automatic tracking of multi-generational electron histories.
  • Automatic calculations of emittance and current density.
  • Formatted text output files make it easy to transfer information to user applications or to mathematical analysis programs.
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» Trak 6.0 instructions manual
» Illustrated example of a Trak solution
» Preprint, new plasma-surface capability